2470

Features:

• Wide coverage up to 1100 V / 1 A DC 20 W max.
• 10 fA measure resolution
• 0.012% basic measure accuracy with 6½-digit resolution
• Five-inch, high resolution capacitive touch screen GUI
• Source and sink (4-quadrant) operation
• SCPI and TSP® scripting programming modes
• TSP-Link for multi-channel I-V testing
• Front panel input banana jacks; rear panel high-voltage input triaxial connections
• Built-in context-sensitive help
• Front-panel USB 2.0 memory I/O port for transferring data, test scripts, and test configurations

Description:

The 2470 High Voltage SourceMeter® Source Measure Unit (SMU) Instrument brings advanced Touch, Test, Invent® technology right to your fingertips. It combines an innovative graphical user interface (GUI) with capacitive touchscreen technology to make testing intuitive and minimize the learning curve to help engineers and scientists learn faster, work smarter, and invent easier. With its 1100 V and 10 fA capability, the 2470 is optimized for characterizing and testing high voltage, low leakage devices, materials, and modules, such as silicon carbide (SiC), gallium nitride (GaN), power MOSFETs, transient suppression devices, circuit protection devices, power modules, batteries, and much more. These new capabilities, combined with Keithley’s decades ofexpertise in developing high precision, high-accuracy SMU instruments, make the 2470 a “go-to instrument” for highvoltage source and low-current measurement applications in the lab and in the test rack.